G - Physics – 21 – F
Patent
G - Physics
21
F
204/96.34, 95/94
G21F 3/00 (2006.01) C23C 14/04 (2006.01) C23C 16/28 (2006.01) G03F 1/14 (2006.01)
Patent
CA 1191477
X-RAY MASK SUBSTRATE AND METHOD OF FABRICATION THEREOF ABSTRACT An improved X-ray lithography mask has been fabricated by forming an X ray absorbing lithography pattern on a supporting foil of hydrogenated amorphous carbon. The substrate foil is formed by depositing a carbon film in the presence of hydrogen onto a surface having a temperature below 375°C. The hydrogen con- centration is maintained sufficiently high that the resulting film has at least one atom percent of hydrogen. A film having about 20 atom percent of hydrogen is preferred. While impurities are permitted, impurities must be maintained at a level such that the optical bandgap of the resulting film is at least one electron volt. A film with an optical bandgap of about 2 electron volts is preferred.
426785
Brady Michael J.
Meyerson Bernard S.
Warlaumont John M.
International Business Machines Corporation
Rosen Arnold
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