G - Physics – 21 – K
Patent
G - Physics
21
K
G21K 1/06 (2006.01)
Patent
CA 2642736
An x-ray reflector is provided. The x-ray reflector has a substrate and a multilayer structure coupled to the substrate. The multilayer structure is of fixed curvature and has at least two distinct groups of d-spacings. The x-ray reflector may reflect a plurality of x-ray frequencies.
Jiang Licai
Verman Boris
Macrae & Co.
Osmic Inc.
LandOfFree
X-ray reflector system for reflecting a plutality of x-ray... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with X-ray reflector system for reflecting a plutality of x-ray..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-ray reflector system for reflecting a plutality of x-ray... will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1527183