Laser altimeter and probe height sensor

Details Laser altimeter and probe height sensor Laser altimeter and probe height sensor

G - Physics

09

B

340/136, 354/3,

G09B 9/30 (2006.01) G01C 3/10 (2006.01)

Patent

CA 1149953

Abstract The disclosure describes an arrangement to measure precisely probe-to-model board distance in a simulator. A source of radiation is positioned to emit a beam toward a model board surface on which a scaled terrain model is constructed. A fixed position lens collects reflected radiation and directs it onto a sensor device which develops an electrical signal indicative of displacement of the reflected beam, which, in turn, varies directly as the distance between the probe and the model board surface. One embodiment describes an arrangement in accordance with the Scheimpflug condition whereby focus is maintained without concern for the depth of field as the probe approaches and withdraws from the surface of the model board.

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