G - Physics – 01 – B
Patent
G - Physics
01
B
354/25, 33/60
G01B 11/06 (2006.01)
Patent
CA 1292803
ABSTRACT OF THE DISCLOSURE A film thickness measuring device for measuring the thickness of a film formed on a sheet member conveyed with the rotation of a rotary shaft. The thickness measurement is accomplished based on averaged values for a period of time which is determined according to the rotation speed of the rotary shaft. Consequently, errors due to the eccentricity or uneven surface of the rotary shaft are removed from the measurement values resulting in improving an accuracy of the thickness measurement of the film.
535948
Ariki Masayuki
Ida Yoshiaki
Nagao Toshishige
Ariki Masayuki
Ida Yoshiaki
Mitsubishi Denki Kabushiki Kaisha
Nagao Toshishige
Riches Mckenzie & Herbert Llp
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