G - Physics
01
J
73/58
G01J 1/42 (2006.01) G01N 21/47 (2006.01)
Patent
CA 1201299
ABSTRACT Reflectance apparatus is disclosed for obtaining the measurement of reflected light in which a light trap is positioned in the light path between the specimen and the detector to minimize stray light reflected from the specimen being analyzed as light from the light source is reflected from the specimen to the detector.
435316
Miles Laboratories Inc.
Osler Hoskin & Harcourt Llp
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