G - Physics – 06 – K
Patent
G - Physics
06
K
354/21, 350/32
G06K 9/00 (2006.01) G06T 7/40 (2006.01)
Patent
CA 1223355
Abstract of the Disclosure There is disclosed a method and an apparatus for automatic quantitative measurement of textures by image analysis for measuring textures of a material containing various optically anisotropic textures. An image of the material is divided into a plurality of sections and brightness of each section is classified into a plurality of stages to be stored as gray levels of the sections or pixels. Image patterns of the textures are recognized on the basis of gray level variations observed before and after a mask movement, and the textures of the material are determined according to predetermined criteria.
477493
Kimura Atsushi
Mori Makihiko
Nakamura Kazuo
Tanabe Kanichiro
Marks & Clerk
Nireco Corporation
Osaka Gas Company Limited
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