Method for continuously monitoring oxide thickness on moving...

Details Method for continuously monitoring oxide thickness on moving... Method for continuously monitoring oxide thickness on moving...

C - Chemistry, Metallurgy

25

D

334/22

C25D 11/12 (2006.01) C25D 11/04 (2006.01) C25D 21/12 (2006.01)

Patent

CA 1216035

METHOD FOR CONTINUOUSLY MONITORING OXIDE THICKNESS ON MOVING ALUMINUM FOIL Abstract of the Disclosure Either after or during the process of forming aluminum foil for use in electrolytic capacitors, the formed oxide foil is drawn through two separate electro- lytes wherein electrodes are immersed. An AC voltage source connected between the electrodes provides a resulting reactive current which is a direct measure of the potential capacitance per unit foil area that can be obtained in capacitor manufacturing, and which is also an indirect measure of the oxide film thickness.

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