Apparatus for measuring characteristics of electronic devices

Details Apparatus for measuring characteristics of electronic devices Apparatus for measuring characteristics of electronic devices

G - Physics

01

R

356/117

G01R 31/26 (2006.01)

Patent

CA 1278880

Abstract An electronic device measurement apparatus measures a characteristic of an electronic device under test (DUT) by applying a smoothly changing voltage from one terminal of a voltage supply means to an ungrounded terminal of the DUT and detecting a current flowing through the DUT. The current flowing through the DUT does not include a looping error component. A current detection resistor is connected between another terminal of the voltage supply means and a grounded terminal of the DUT. Since the voltage applied to the DUT is a sine squared wave voltage, the pure current flowing through the DUT is detected by detecting cosine- wave and sine-wave components from the ungrounded terminal of the DUT and obtaining the difference between the voltage across the current detection resistor and the cosine-wave and sine-wave com- ponents.

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