G - Physics – 01 – L
Patent
G - Physics
01
L
73/52
G01L 1/24 (2006.01) G01N 25/72 (2006.01)
Patent
CA 1325731
STRESS ANALYZER WITH AUTOMATIC OVERLOAD RESPONSE Abstract of the Disclosure An object stress analyzing system includes a scanning head with a detector, a variable gain amplifier and a control unit which controls the scanning head and which acquires stress- related data from the amplifiers. The control unit responds to detector overload conditions by automatically adjusting the gain of the amplifier, rescanning a portion of the object and rescaling data acquired prior to occurrence of the overload condition.
602029
Borden Ladner Gervais Llp
Deere & Company
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