Stress analyzer with automatic overload response

G - Physics – 01 – L

Patent

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73/52

G01L 1/24 (2006.01) G01N 25/72 (2006.01)

Patent

CA 1325731

STRESS ANALYZER WITH AUTOMATIC OVERLOAD RESPONSE Abstract of the Disclosure An object stress analyzing system includes a scanning head with a detector, a variable gain amplifier and a control unit which controls the scanning head and which acquires stress- related data from the amplifiers. The control unit responds to detector overload conditions by automatically adjusting the gain of the amplifier, rescanning a portion of the object and rescaling data acquired prior to occurrence of the overload condition.

602029

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