Method of testing bubble memory devices

Details Method of testing bubble memory devices Method of testing bubble memory devices

G - Physics

11

C

352/37.2

G11C 29/00 (2006.01)

Patent

CA 1210863

METHOD OF TESTING BUBBLE MEMORY DEVICES ABSTRACT OF THE DISCLOSURE A method of testing bubble memory devices each having a plurality of minor loops, the method being useful for detecting defective minor loops in a short time. In this method, data to be written in and/or data to be read out is divided into a plurality of blocks, the bubble memory device is sequentially operated under driving magnetic field and/or bias magnetic field conditions different for every block, and a defective minor loop or loops are detected by comparing readout data with write in data.

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