H - Electricity – 04 – N
Patent
H - Electricity
04
N
350/32, 341/56,
H04N 7/18 (2006.01) G01N 21/90 (2006.01)
Patent
CA 1196085
ABSTRACT OF THE DISCLOSURE An inspection device for an apparatus for inspecting objects, such as glass bottles and the like, for defects includes an interface circuit connected between a source of data signals and means for processing information obtained from the object. The interface circuit receives the data signals, typically in digital series form from a photodiode camera and light source, and includes a latch for storing one of the digital signals, a pair of adders, and a storage means for a plurality of threshold signals. Each data signal is compared to the preceding data signal stored in the latch in one of the adders to generate a difference signal representing the difference in magnitudes between the two signals. Each difference signal is compared with a selected one of the stored threshold signals in the other adder to generate an event signal representing the difference in magnitudes between the two signals. The means for processing information includes a pair of control units and a master control means for alternately connecting the control units to the interface means, whereby one of the control units is receiving a group of the event signals representing one object while the other control unit is processing a preceding group of the event signals. Signals are also generated to identify the location of each event signal with respect to a corresponding photodiode and to identify during which vertical sweep of the object the event signal was generated to associate the event signal with a point on the object, The event signals are processed to identifiy defects. Events in proximity in the same sweep are identified as a string. Event magnitudes and totals in a -37- string are compared with predetermined values to identify defects. Strings in proximity are identified as a blob. Event magnitudes and totals and blob width are compared with predetermined values to identify defects. The event signals can be displayed as a two-dimensional representation of the surface of the object, as if it had been cut and unwrapped. The operator can repeat the inspection utilizing different threshold values to optimize the defect detection performance of the inspection device. If the storage means is disabled and the threshold signals magnitudes are set at zero, the data signals will pass through to be displayed as the data signal magnitudes on one orthogonal axis and the Location of the associated points on the other axis. -38-
388338
G. Ronald Bell & Associates
Owens-Illinois Inc.
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