G - Physics – 01 – J
Patent
G - Physics
01
J
73/55
G01J 3/46 (2006.01) G01J 9/02 (2006.01)
Patent
CA 1170075
METHOD AND APPARATUS FOR THE INTERFEROMETRIC WAVELENGTH MEASUREMENT OF FREQUENCY TUNABLE C.W. LASERS Abstract of the Disclosure The invention relates to a method and an apparatus for measuring the wavelength of an object beam of electromagnetic radiation generated from a first source means by comparing with a reference beam of known wavelength generated from a second source means, A fringe-countiny Michelson-type interferometer is used, which has a stationary arm and a variable arm and in- cludes planar beam splitting means for splitting each of the reference and object beams into first and second beam portions, planar beam mixing means for recombining the respective first and second beam portions of the reference and object beams, planar reflection means arranged in the stationary arm for reflecting the respective first beam portion of the reference and object beams to the beam mixing means and movable retroreflection means having an optical center and arranged in the variable arm for reflecting the res- pective second beam portion of the reference and object beams to the beam mixing means. Prior to moving the retroreflection means, the reference and object beams are aligned to provide a flat interference pattern for each beam sent to the beam splitting means at only one incident direction, by causing the reference and object beams to travel along respective optical paths lying in respective parallel planes which normally intersect the planes of the beam splitting means, the - 1 - beam mixing means and the reflection means and pass through the optical center of the retroreflection means, the respective second beam portion of the reference and object beams being directed to and reflected by the retroreflection means off center thereof, reflecting with the reflection means the respective first beam portion of the reference and object beams at an angle of reflection .alpha., and disposing the beam mixing means relative to the beam splitting means such that the plane of the beam mixing means is angularly inclined with respect to the plane of the beam splitting means by an angle equal to .alpha. and that the beam mixing means is oriented to receive the respective reflected first and second beam portions of the reference and object beams symmetrically with respect to the plane thereof. Parallelism of the second beam portions with one another in the variable arm of the interferometer is auto- matically provided as a result of the alignment of the reference and object beams to a flat interference pattern, without optical feedback of the beams to their respective source means and parasitic diffraction effects by the retroreflection means. - 2 -
391752
Monchalin Jean-Pierre
Swabey Ogilvy Renault
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