Dual level pattern recognition system

Details Dual level pattern recognition system Dual level pattern recognition system

G - Physics

06

K

354/57

G06K 9/80 (2006.01) G06K 9/68 (2006.01)

Patent

CA 1213983

Abstract of the Invention A pattern recognition system has both coarse and fine levels of analysis in which a coarse array representation of a workpiece pattern is formed and used to identify the workpiece pattern as either a reference character or as a member of an ambiguous set of reference characters which are represented by identical coarse array representations. At least portions of a fine array representation of a workpiece pattern which has been classified as a member ofa set of reference characters are compared to corresponding portions of fine array representations of reference characters in the set identified by the classification. The pattern recognition system has a learning system through which reference characters may be introduced into the recognition system and through which a representation of a workpiece pattern which was not identified may be incorporated into an existing set of reference characters of the recognition system.

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