Method and apparatus for measuring moments acting upon an...

Details Method and apparatus for measuring moments acting upon an... Method and apparatus for measuring moments acting upon an...

G - Physics

01

L

73/86

G01L 3/14 (2006.01) G01L 5/16 (2006.01) G01M 9/00 (2006.01)

Patent

CA 1264020

Abstract: A method and apparatus for measuring at least one moment acting about a predetermined axis on an object under investigation. A force component acting at a first force introduction point onto said object under investigation perpendicular to a normal from said first introduction point to said axis is measured. Then a differential moment caused by displacement of said object between said first force introduction point to a present second force introduction point is determined and said displacement is calculated by dividing said differential moment by said measured force component. A predetermined distance between said first force introduction point is corrected by said displacement and finally said measured force component is multiplied by said corrected distance in order to gain an accurate value for the moment to be measured.

503389

Affiliated with

Also associated with

Rating

Method and apparatus for measuring moments acting upon an... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for measuring moments acting upon an..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for measuring moments acting upon an... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1280280