Electro-optic measurements of voltage waveforms on...

G - Physics – 01 – R

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324/59, 324/79

G01R 31/28 (2006.01) G01R 1/07 (2006.01) G01R 13/00 (2006.01) G01R 29/00 (2006.01)

Patent

CA 1313223

Abstract This invention describes a method and apparatus for measuring a voltage waveform of an electrical signal on an electrical conductor. A signal is generated on the conductor, and a crystal is positioned over or on the conductor. A polarized light beam is directed through the crystal along a direction essentially perpendicular to the conductor. Birefringence is induced in the crystal, and the polarization of the beam is modulated in response essentially to only those components of the electrical field generated by the signal that are perpendicular to the conductor. The final step involves detecting the modulated polarization of the beam to generate a voltage waveform corresponding to that on the conductor.

591587

LandOfFree

Say what you really think

Search LandOfFree.com for Canadian inventors and patents. Rate them and share your experience with other people.

Rating

Electro-optic measurements of voltage waveforms on... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electro-optic measurements of voltage waveforms on..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electro-optic measurements of voltage waveforms on... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFCA-PAI-O-1290017

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.