G - Physics – 01 – N
Patent
G - Physics
01
N
349/42
G01N 29/04 (2006.01) G01N 29/12 (2006.01) G01N 29/34 (2006.01) G01N 29/44 (2006.01) G01N 29/46 (2006.01)
Patent
CA 1169955
Abstract: A method of inspecting non-destructively a specimen for examining the presence or absence of a defect in the specimen, in which an ultrasonic wave is emitted from a probe and a reflected wave from the specimen is received by the probe whose output signal is processed to determine the presence or absence of the defect. The signal processing includes steps of extracting character- istic parameters from a frequency spectrum of the ultra- sonic echo and comparing the extracted parameter with corresponding experimentally or theoretically determined values. The invention makes it possible to automatically determine discriminatively whether the reflector of the ultrasonic echo is a configured portion, a weld boundary or a defect of a specimen to be inspected.
380071
Hitachi Ltd.
Kirby Eades Gale Baker
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