Control means and method for optical inspection system

Details Control means and method for optical inspection system Control means and method for optical inspection system

G - Physics

06

K

342/21

G06K 9/80 (2006.01) G01N 21/01 (2006.01) G01N 21/956 (2006.01) G06K 9/74 (2006.01)

Patent

CA 1313243

CONTROL MEANS AND METHOD FOR OPTICAL INSPECTION SYSTEM Abstract of the Disclosure Operation of system components is automatically monitored, controlled and coordinated. The presence at an inspection station of each successive one of the objects to be inspected is automatically detected. Inspection of each such object commences in response to its detection when the monitoring of other system components indicates that they are ready for commencement of the new inspection cycle. The inspection system includes a rotatable disk having mask apertures that move into the line of sight of a light detector. Signals produced by scanning of timing marks upon the disk reflect which one of the plurality of masks is present in the optical path, and determine the intensity of the transform image sampled by said mask means.

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