Method and apparatus for scanning an ion trap mass spectrometer

Details Method and apparatus for scanning an ion trap mass spectrometer Method and apparatus for scanning an ion trap mass spectrometer

H - Electricity

01

J

H01J 49/26 (2006.01) H01J 49/02 (2006.01) H01J 49/40 (2006.01)

Patent

CA 2626701

A mass spectrometer system having an ion trap and a downstream mass spectrometer is provided. A plurality of groups of ions are provided to the ion trap and a first mass-to-charge ratio is selected. The downstream mass spectrometer is configured to filter out one of (i) ions having a first unselected mass-to-charge ratio different from the first mass-to- charge ratio, and (ii) mass signals for ions having the first unselected mass-to- charge ratio different from the first mass-to-charge ratio. A first group of ions is ejected of the first mass-to-charge ratio from the ion trap to the downstream mass spectrometer.

L'invention porte sur un système de spectromètre de masse comprenant un piège à ions et un spectromètre de masse aval. Selon l'invention, on fournit une pluralité de groupes d'ions au piège à ions et l'on choisit un premier rapport masse-charge. On configure le spectromètre de masse aval pour filtrer (i) les ions possédant un premier rapport masse-charge non choisi qui est différent du premier rapport masse-charge précité, ou (ii) les signaux de masse des ions possédant le premier rapport masse-charge non choisi qui est différent du premier rapport masse-charge précité. On éjecte un premier goupe d'ions du premier rapport masse-charge du piège à ions vers le spectromètre de masse aval.

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