Annihilation radiation analysis

G - Physics – 01 – N

Patent

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G01N 9/36 (2006.01) G01N 9/24 (2006.01) G01N 23/00 (2006.01) G01N 23/203 (2006.01) G01N 23/22 (2006.01) G01T 1/178 (2006.01) G01T 1/20 (2006.01) G01V 5/00 (2006.01)

Patent

CA 1157169

ABSTRACT The invention relates to an apparatus and method for quantitatively measuring the concentration of a first element or group of elements having substantially similar atomic numbers in a matrix comprising other elements having substantially different atomic numbers to that or those of the first element or group of elements. The apparatus comprises: (I) a source yielding gamma-rays, of sufficient energy for pair production; (II) a detector or detectors associated with the gamma-ray source which is capable of detecting 0.511 MeV annihilation radiation; (III) a measur- ing system capable of making a measurement of, or propor- tional to, bulk density; (IV) a shielding interposed be- tween the gamma-ray source and the detector or detectors in order to reduce the intensity of direct source gamma-rays impinging on the detector or detectors; and (V) a calculator to calculate the concentration associated with the outputs of the detector or detectors and the measuring system which measures bulk density or a property proportional thereto. The measuring system for measuring bulk density or a pro- perty proportional to it must be located so as to make its measurement over substantially the same volume of the matrix as that in which the annihilation radiation origi- nates. One suitable method for measuring bulk density over substantially the same volume is to measure the comption scattered radiation from the same source which is used to generate the pair production gamma-rays.

366511

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