Method for processing semiconductor wafer, method for...

H - Electricity – 01 – L

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H01L 21/306 (2006.01) G06K 19/077 (2006.01) H01L 21/60 (2006.01) H01L 21/68 (2006.01) H01L 21/78 (2006.01) H01L 23/498 (2006.01) H01L 23/538 (2006.01)

Patent

CA 2238974

A semiconductor wafer is thinned with an excellent workability without any crack and any warp. The thinning is performed through a first step of preparing a carrier (1) composed of a base material (1a) and a suction pad (1b) provided on one side of the material (1a), a second step of forming a composite wafer (10) by joining a semiconductor wafer (2) to the carrier (1) with the back having no circuit element of the wafer (2) opposite to the carrier (1), and a third step of thinning the wafer (2) by spin-coating the back of the wafer (2) with an etchant while clamping the carrier (1) with the wafer (2) side of the composite wafer (10) up.

L'invention concerne un procédé pour amincir des tranches de semi-conducteur qui sont très faciles à travailler et ne risquent pas de se fendre ou de se gauchir. Pour amincir ces tranches, on prépare dans une première étape un support (1) constitué d'un matériau de base (1a) et d'une plaquette d'aspiration (1b) sur un côté du matériau (1a). Dans une seconde étape, on forme un composite (10) en joignant une tranche de semi-conducteur (2) au support (1), le côté arrière de la tranche (2) étant exempt d'éléments de circuit à l'opposé du support (1). Dans la troisième étape, on amincit la tranche (2) en lui appliquant par centrifugation un réactif d'attaque sur le côté arrière, pendant que le support (1) est immobilisé avec le côté tranche (2) du composite (10) dirigé vers le haut.

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