Method of avoiding space charge saturation effects in an ion...

H - Electricity – 01 – J

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H01J 49/42 (2006.01)

Patent

CA 2724238

A mass spectrometer is provided comprising a first ion trap (2) arranged upstream of an analytical second ion trap (5). The charge capacity of the first ion trap (2) is set at a value such that if all the ions stored within the first ion trap (2) up to the charge capacity limit of the first ion trap (2) are then transferred to the second ion trap (5), then the analytical performance of the second ion trap (5) is not substantially degraded due to space charge effects.

Linvention concerne un spectromètre de masse comprenant un premier piège à ions (2) disposé en amont dun second piège à ions (5) analytique. La capacité de charge du premier piège à ions (2) est fixée à une valeur telle que si tous les ions stockés dans le premier piège à ions (2) jusquà la limite de capacité de charge du premier piège à ions (2) sont ensuite transférés vers le second piège à ions (5), alors la performance analytique du second piège à ions (5) nest pas sensiblement dégradée à cause des effets de charge despace.

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