Method and apparatus for measuring jitter

Details Method and apparatus for measuring jitter Method and apparatus for measuring jitter

H - Electricity

04

Q

H04Q 1/20 (2006.01)

Patent

CA 2553570

In a method [400] for measuring jitter, a signal under test [220] is inputted [402] to generate signal transition locations. A signal transition location is latched [404] using a sampling clock signal [222], and the signal transition location is converted [406] to a delay value. The delay value is converted [408] to an edge position output [310], and a value of the edge position output [310] is detected [410].

L'invention concerne un procédé (400) qui permet de mesurer la gigue, selon lequel on entre un signal à tester (20) afin de produire des emplacements de transition de signal. On verrouille (404) un emplacement de transition de signal à l'aide d'un signal d'horloge d'échantillonnage (222), et on convertit (406) l'emplacement de transition de signal en une valeur de retard. On convertit (408) la valeur de retard en une sortie de position périphérique (310), et on détecte (410) une valeur de sortie de position périphérique (310).

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