Methods and systems for processing microseismic data

G - Physics – 01 – V

Patent

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G01V 1/28 (2006.01)

Patent

CA 2692947

Methods and systems for processing microseismic waveforms. The methods and systems provide determining a measure of waveform fit in the frequency-domain comprising constructing, in the frequency-domain, at least one of an amplitude misfit functional and a cross phase functional between arrivals; and estimating source parameters and/or model parameters.

La présente invention a trait à des procédés et à des systèmes permettant de traiter des formes d'onde microsismiques. Les procédés et les systèmes comprennent les étapes consistant à : déterminer une mesure d'ajustement de forme d'onde dans le domaine fréquentiel ; construire, dans le domaine fréquentiel, une fonctionnelle inadaptée à l'amplitude et/ou une fonctionnelle de phase croisée entre les arrivés ; et estimer des paramètres de source et/ou des paramètres de modèle.

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