Method for analysis of neurite growth

G - Physics – 01 – N

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G01N 33/50 (2006.01)

Patent

CA 2762322

The invention relates to a method for analyzing axon growth, wherein a substrate having a grid pattern comprises first regions on which neurons and neuron-like cells can build up, wherein the first regions are each encompassed by second regions on which neurons and neuron-like cells cannot build up, wherein neurons or neuron-like cells are built up on the first regions of the substrate and then the neurons or neuron-like cells are exposed to one or more or no treatments, and during said treatment and/or thereafter the axon growth from the neurons or the neuron-like cells is analyzed, to which end the connections arising between the first regions due to axon growth are detected and quantified.

L'invention concerne un procédé d'analyse de la croissance neuritique selon lequel un substrat est préparé avec un motif de grille, lequel présente des premières régions sur lesquelles des neurones et des cellules analogues aux neurones peuvent se fixer, les premières régions étant respectivement entourées par des deuxièmes régions sur lesquelles des neurones et des cellules analogues aux neurones ne peuvent pas se fixer, des neurones ou des cellules analogues aux neurones étant fixées sur les premières régions du substrat et les neurones ou cellules analogues aux neurones étant ou n'étant pas ensuite exposés à un ou plusieurs traitements et les excroissances neuritiques des neurones ou des cellules analogues aux neurones étant analysées pendant ce temps ou par la suite. À cet effet, les liaisons se formant entre les premières régions en raison des excroissances neuritiques sont détectées et quantifiées.

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