Substrates, systems and methods for analyzing materials

Details Substrates, systems and methods for analyzing materials Substrates, systems and methods for analyzing materials

G - Physics

01

N

G01N 21/63 (2006.01) G01N 21/64 (2006.01) G01N 21/77 (2006.01) C12Q 1/68 (2006.01) C40B 60/00 (2006.01)

Patent

CA 2662521

Substrates, systems and methods for analyzing materials that include waveguide arrays disposed upon or within the substrate such that evanescent fields emanating from the waveguides illuminate materials disposed upon or proximal to the surface of the substrate, permitting analysis of such materials. The substrates, systems and methods are used in a variety of analytical operations, including, inter alia, nucleic acid analysis, including hybridization and sequencing analyses, cellular analyses and other molecular analyses.

La présente invention concerne des substrats, des systèmes et des procédés servant à analyser des matériaux qui comprennent des matrices de guide d'onde sur ou dans le substrat de telle sorte que les champs évanescents émanant des guides d'onde éclairent les matériaux disposés sur ou à proximité de la surface du substrat, permettant l'analyse de tels matériaux. Ces substrats, systèmes et procédés sont utilisés dans une variété d'opérations analytiques, comprenant entre autre l'analyse d'acide nucléique, y compris l'hybridation et les analyses de séquençage, les analyses cellulaires et d'autres analyses moléculaires.

Affiliated with

Also associated with

Rating

Substrates, systems and methods for analyzing materials does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Substrates, systems and methods for analyzing materials, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Substrates, systems and methods for analyzing materials will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1612467