G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 35/00 (2006.01)
Patent
CA 2148636
Disclosed is a test strip overturning mechanism in an automated analyzer for arranging test strips such that the right sides thereof may face in one direction, which comprises: an overturning device having an arm portion with suction holes being formed thereon; and a motor connected to the overturning device via a rotary shaft, wherein the suction holes formed on the arm portion are aligned in a straight line with suction holes formed on a transportation stage, arranged in the direction orthogonal to the direc- tion that the test strips are moved; and a turntable is disposed at the position corresponding to the location of the arm portion when the overturning device is turned 180° round the rotary shaft.
Takahashi Keiji
Yokota Hiroshi
Corporation Bayer
Osler Hoskin & Harcourt Llp
LandOfFree
Test strip overturning mechanism in automated analyzer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Test strip overturning mechanism in automated analyzer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test strip overturning mechanism in automated analyzer will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1631629