Polarization based interferometric detector

Details Polarization based interferometric detector Polarization based interferometric detector

G - Physics

01

N

G01N 21/41 (2006.01) C40B 20/08 (2006.01) C40B 30/10 (2006.01) C40B 30/04 (2006.01)

Patent

CA 2649421

A sensor and method for determining the optical properties of a sample material is disclosed. The sensor comprises a light source that generates a linearly polarized light beam having a predetermined polarization orientation with respect to the plane of incidence. The linearly polarized light beam is reflected off the sample and is split into second and third light beams where the second and third light beam consist of the combined projections of mutually orthogonal components of the first light beam. A signal processor measures the intensity difference between the second and third light beams to calculate the phase difference induced by the sample material.

L'invention concerne un capteur et un procédé destinés à déterminer les propriétés optiques d'un matériau d'échantillon. Le capteur comprend une source de lumière qui produit un faisceau lumineux polarisé de façon linéaire possédant une orientation de polarisation prédéfinie par rapport au plan d'incidence. Le faisceau lumineux polarisé de façon linéaire est réfléchi hors de l'échantillon et est divisé dans le deuxième et le troisième faisceau lumineux, lesquels consistent en des projections combinées de composants mutuellement orthogonaux du premier faisceau lumineux. Un processeur de signaux mesure la différence d'intensité entre les deuxième et troisième faisceaux lumineux en vue de calculer la différence de phase induite par le matériau d'échantillon.

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