G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 27/414 (2006.01) G01N 33/543 (2006.01)
Patent
CA 2121797
2121797 9308464 PCTABS00021 A method and application for detecting and measuring the presence of a binding target material (64) employs a semiconductor device (50) having a receptor-covered surface (90) topgate (60), separated by a dielectric layer (58) from a substrate (56). Receptors (66) attached to this surface exhibit a chemical selectivity function. Binding occurs in a test solution (52), with charge associated with the target material (64) modulating at least one device characteristic. According to the present invention, measurement may occur under dry conditions, at a time and location different from when binding occurred, thus substantially eliminating problems associated with ionic shielding and reference electrodes, so prevalent with prior art wet measurement techniques. Preferably the device (50) includes backgate (62) to which a bias may be applied to restore the device's pre-binding characteristics. Measurement of the restorative backgate bias provides a signal indicating binding of the desired target material.
Holm-Kennedy James W.
Smart & Biggar
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