Method and apparatus for sample analysis

Details Method and apparatus for sample analysis Method and apparatus for sample analysis

G - Physics

01

N

G01N 30/08 (2006.01) G01N 1/18 (2006.01)

Patent

CA 2555998

Methods and systems for analyzing samples, such as gas samples, are described. One method comprises providing a gas sample, increasing pressure applied to the gas sample to compress the sample to a smaller volume and provide a pneumatically focused gas sample, and analyzing the pneumatically focused gas sample using any of a variety of analytical techniques. Also disclosed are systems for gas analysis, including systems for analysis of pneumatically focused, and thereby concentrated, gas samples and for analysis of particulate matter in gas samples. Analytical systems constructed within personal computer cases also are disclosed.

L'invention concerne des procédés et des systèmes pour analyser des échantillons, tels que des échantillons gazeux. Un procédé comprend la production d'un échantillon gazeux, l'augmentation de la pression appliquée à l'échantillon gazeux, de manière à comprimer l'échantillon dans un volume plus petit et à produire un échantillon gazeux focalisé de manière pneumatique, l'analyse dudit échantillon gazeux focalisé de manière pneumatique, au moyen d'une pluralité de techniques analytiques. L'invention concerne également des systèmes pour des analyses gazeuses, comprenant des systèmes permettant d'analyser les échantillons gazeux focalisés de manière pneumatique, concentrés, et permettant d'analyser des matières particulaires dans les échantillons gazeux. L'invention concerne également des systèmes analytiques construits à l'intérieur d'un ordinateur personnel.

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