High accuracy beam blanker

H - Electricity – 01 – L

Patent

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Details

H01L 21/027 (2006.01) H01J 3/26 (2006.01) H01J 37/04 (2006.01)

Patent

CA 2069767

The accuracy of a double-deflection beam blanker is dramatically improved for all blanker voltages by using provided, closed-form, trajectory equations to determine the blanker geometric parameters and compensating for fringe-field affects in order to precisely determine the delay line length for control of an electron or ion beam. This delay line length is maintained by placing alignment apertures above and below the blanker.

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