Mass spectrometer

Details Mass spectrometer Mass spectrometer

H - Electricity

01

J

H01J 49/26 (2006.01) H01J 49/42 (2006.01)

Patent

CA 2436880

A mass spectrometer is disclosed comprising at least a first and second ion trap T1,T2 which are arranged in series. A relatively high AC or RF voltage is applied to the electrodes forming the first ion trap T1 in order to improve the trapping of energetic or high mass to charge ratio ions. The relatively high AC or RF voltage applied to the first ion trap T1 also has the effect of raising the low mass cut-off of the first ion trap. The second ion trap T2 arranged downstream of the first ion trap T1 is arranged to have a lower low mass cut-off than the first ion trap T1, and hence ions which are not trapped in the first ion trap T1 are trapped in the second ion trap T2.

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