Non-intrusive state observation of vlsi circuits using...

Details Non-intrusive state observation of vlsi circuits using... Non-intrusive state observation of vlsi circuits using...

H - Electricity

01

L

H01L 21/66 (2006.01)

Patent

CA 2135697

Abstract An integrated circuit has electrically resistive elements connected to selected locations in the circuit. Upon activity at that location, current is passed to the element to elevate its temperature. The elevated temperature may be observed and the operation of the circuit verified. The resistive elements may be formed integrally with the circuit.

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