Method and apparatus for automatically testing semiconductor...

G - Physics – 01 – R

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G01R 31/26 (2006.01) G01R 31/01 (2006.01)

Patent

CA 2162653

A portable electronic test instrument is adapted for the automatic testing of semiconductor diodes regardless of the orientation of the diode relative to the test probes. The test instrument supplies an a.c. sine wave test voltage coupled to the test probes. The maximum negative voltage and the maximum positive voltage are measured and compared against a set of predetermined open and short circuit values to obtain a decision of open, short, or ok for each value. The combination of the two comparisons is used to determine the device status according to a decision criteria. The diode status is accordingly displayed on the graphical display of the test instrument, indicating the device is open, shorted, a diode with a forward orientation or a reverse orientation with respect to the test probes, or of an unknown type. The diode forward bias junction voltage is displayed regardless of its orientation.

Instrument d'essai électronique portatif adapté à l'essai automatique de diodes à semi-conducteurs sans égard à l'orientation de la diode par rapport aux sondes d'essai. L'instrument d'essai applique une tension d'essai sinusoïdale c.c. aux sondes d'essai. La tension négative maximale et la tension positive maximale sont mesurées et comparées à un ensemble de valeurs prédéterminées de circuit ouvert et de court-circuit afin d'obtenir une décision (ouvert, court-circuité ou OK) pour chaque valeur. La combinaison de deux comparaisons permet de déterminer l'état du dispositif conformément aux critères de décision. L'état de la diode est ainsi affiché sur l'écran graphique de l'instrument d'essai, indiquant s'il s'agit d'un dispositif ouvert, court-circuité, d'une diode à polarisation directe ou inverse par rapport aux sondes d'essai, ou d'un type inconnu. La tension à la jonction de polarisation directe de la diode est affichée sans égard au sens de la polarisation.

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