Method and apparatus for scanning optical delay line

Details Method and apparatus for scanning optical delay line Method and apparatus for scanning optical delay line

G - Physics

02

B

G02B 26/10 (2006.01) G02B 26/00 (2006.01) G02B 27/14 (2006.01)

Patent

CA 2524242

A scanning optical delay line includes an optical path element that rotates about its central axis, such that a face is intermittently incident a beam of light to be optically delayed. When the beam is not incident the face, it is reflected onto a reinsertion line which provides a second opportunity for the beam to intersect the optical path element. The optical path element may include one or more parallelogram prisms, or parallel reflective surfaces to provide a substantially linear optical path length variation during the scan, which is produced by the rotation of the optical path element. A highly linear part of the rotation can be maximally used providing a high duty cycle, high linearity scanning optical delay line that permits high quality, high data rate applications.

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