Method for the testing of electronic components

Details Method for the testing of electronic components Method for the testing of electronic components

G - Physics

01

R

G01R 31/00 (2006.01) G01R 31/01 (2006.01) G01R 31/02 (2006.01) G01R 31/26 (2006.01) G01R 31/28 (2006.01)

Patent

CA 2313346

A method for the testing of electronic components comprises an interface driving a test device. The interface can be parameterized according to the test. The test method provides for a first and only learning phase during which a measurement date that is the earliest possible date is determined. This method thereafter comprises the performance of adjusting phases to define adjusted measurement dates, used during an application phase. The adjusting phases are short, fast and precise, and are used to optimize the total performance time of a test and, simultaneously, also the profitability of production. Indeed, the measurement dates are determined with respect to the totalized populations.

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