System and method for testing a data storage device without...

G - Physics – 11 – C

Patent

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G11C 29/00 (2006.01) G06F 12/14 (2006.01)

Patent

CA 2570401

A system and method for testing a data storage device without revealing memory content. To control the individual bits of the memory during testing each value is written into the memory according to the equation NEW_DATA = CURRENT_DATA XOR DATA_SEED such that individual bits of NEW_DATA are equal to CURRENT_DATA with selected bits inverted when the corresponding positions in DATA_SEED are high. NEW_DATA is written into the memory, read out and verified, so that all bit positions can be controlled and tested in both logic states, while NEW_DATA and CURRENT_DATA are not ascertainable by the testing software.

L'invention concerne un système et un procédé permettant de tester un dispositif de stockage de données sans révéler le contenu de la mémoire. Pour contrôler les bits individuels de la mémoire durant le test, chaque valeur est écrite dans la mémoire en fonction de l'équation NOUVELLES_DONNEES=DONNEES_ACTUELLES OUEXCLUSIF DEPART_DE_DONNEES afin que les bits individuels de chaque NOUVELLES_DONNEES soient identiques aux DONNEES_ACTUELLES avec des bits sélectionnés inversés lorsque les positions correspondantes dans le DEPART_DE_DONNEES sont élevées. Les NOUVELLES_DONNEES sont écrites dans la mémoire, extraites et vérifiées, pour que toutes les positions de bit soient contrôlées et testées dans les deux états logiques, les NOUVELLES_DONNEES et les DONNEES_ACTUELLES n'étant pas vérifiables à l'aide du logiciel de test.

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