Measuring position for microwave components

Details Measuring position for microwave components Measuring position for microwave components

G - Physics

01

R

356/117, 324/58.

G01R 31/26 (2006.01) G01R 1/067 (2006.01)

Patent

CA 2026369

ABSTRACT OF THE DISCLOSURE A measuring position for a microwave component having a carrier (10) for the microwave component and having at least one test probe (5). The measuring position provides for non- destructive identification of the properties of microwave circuits on small substrate surfaces even when measuring quasi-planar circuits having connecting lines in asymmetrical microstrip line technology. The spatial position of the test probe (5) is variable and adjustable in three spatial directions relative to the spatial position of the carrier (10).

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