Method and device for measuring the thickness of any deposit...

Details Method and device for measuring the thickness of any deposit... Method and device for measuring the thickness of any deposit...

G - Physics

01

B

G01B 7/06 (2006.01)

Patent

CA 2750307

A method of measuring the thickness of any deposit of material (28) on an inner wall (12) of a structure (14). The method comprises: (a) causing vibrations in the structure; (b) detecting said vibrations in the structure; (c) determining a resonance frequency of the structure based on the detected vibrations; and (d) determining the thickness of any deposit of material on the inner wall of the structure based on the determined resonance frequency.

L'invention porte sur un procédé de mesure de l'épaisseur de tout dépôt de matériau (28) sur une paroi interne (12) d'une structure (14). Le procédé consiste : (a) à provoquer des vibrations dans la structure ; (b) à détecter lesdites vibrations dans la structure ; (c) à déterminer une fréquence de résonance de la structure sur la base des vibrations détectées, et (d) à déterminer l'épaisseur de tout dépôt de matériau sur la paroi interne de la structure sur la base de la fréquence de résonance déterminée.

Affiliated with

Also associated with

Rating

Method and device for measuring the thickness of any deposit... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and device for measuring the thickness of any deposit..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and device for measuring the thickness of any deposit... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1875994