Method and apparatus for reducing space charge in an ion trap

H - Electricity – 01 – J

Patent

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H01J 49/26 (2006.01) H01J 3/40 (2006.01) H01J 49/02 (2006.01)

Patent

CA 2710991

Ion trap apparatus and methods for efficiently addressing the effects of charge space caused by ion trap overfilling, useful in linear ion traps of mass spectrometers.

L'invention concerne un appareil de piégeage d'ions et des procédés pour traiter efficacement les effets de la charge spatiale provoquée par la surcharge du piège à ions, et que l'on peut utiliser dans des pièges linéaires à ions de spectromètres de masse.

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