H - Electricity – 01 – J
Patent
H - Electricity
01
J
H01J 49/26 (2006.01) H01J 3/40 (2006.01) H01J 49/02 (2006.01)
Patent
CA 2710991
Ion trap apparatus and methods for efficiently addressing the effects of charge space caused by ion trap overfilling, useful in linear ion traps of mass spectrometers.
L'invention concerne un appareil de piégeage d'ions et des procédés pour traiter efficacement les effets de la charge spatiale provoquée par la surcharge du piège à ions, et que l'on peut utiliser dans des pièges linéaires à ions de spectromètres de masse.
Bereskin & Parr Llp/s.e.n.c.r.l.,s.r.l.
Dh Technologies Development Pte. Ltd.
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