Method and system of tandem mass spectrometry without...

H - Electricity – 01 – J

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H01J 49/00 (2006.01) H01J 49/40 (2006.01)

Patent

CA 2656481

The invention proposes a method of tandem mass spectrometry for use in a mass spectrometer having a known characteristic function of the mass-to- charge ratio of the ions to be analysed, characterized in that it comprises the following steps: (a) providing a primary ions source to be analysed, (b) generating a primary mass spectrum of the primary ions, without dissociation, wherein said spectrum contains primary ion peaks of occurrence, (c) from the characteristic function values at the maxima of at least some of said primary mass peaks and from the charge values associated to said peaks, determining correlation laws that all possible multiplets of characteristic function values corresponding to multiplets of charged fragments resulting from the dissociation of parent primary ions of interest corresponding to said primary mass peaks have to meet, (d) concurrently dissociating primary ions of interest associated to primary mass peaks, in order to obtain multiplets of charged fragments from each of said parent primary ions, (e) generating characteristic function values for the dissociated fragments, (f) forming every potential multiplet of said characteristic function values, (g) identifying, from amongst said potential multiplets, the multiplets which meet a proximity criterion in relation to said correlation laws, in order to determine the real multiplets of charged fragments corresponding to the parent primary ions, (h) generating dissociation mass spectra corresponding respectively to the parent primary ions of interest, comprising the peaks associated to the real multiplets of identified fragments.

La présente invention concerne un procédé de spectrométrie de masse en tandem à utiliser avec un spectromètre de masse possédant une fonction caractéristique connue du rapport masse sur charge des ions à analyser. Ledit procédé se caractérise en ce qu'il comprend les étapes consistant à : (a) obtenir une source d'ions primaires à analyser ; (b) générer un spectre de masse primaire des ions primaires, sans dissociation, ledit spectre comprenant des pics d'apparition d'ions primaires ; (c) déterminer, à partir des valeurs de la fonction caractéristique au maximum de quelques uns desdits pics de masse primaire au moins et à partir des valeurs de charge associées auxdits pics, les lois de corrélation que tous les multiplets possibles des valeurs de la fonction caractéristique, correspondant aux multiplets des fragments chargés résultant de la dissociation d'ions primaires parents d'intérêt correspondant auxdits pics de masse primaire, doivent satisfaire ; (d) dissocier simultanément les ions primaires d'intérêt associés aux pics de masse primaire, afin d'obtenir des multiplets des fragments chargés provenant de chaque ion primaire parent ; (e) générer des valeurs de fonction caractéristique pour les fragments dissociés ; (f) former chaque multiplet potentiel desdites valeurs de fonction caractéristique ; (g) identifier, parmi lesdits multiplets potentiels, les multiplets qui satisfont à un critère de proximité par rapport auxdites lois de corrélation, afin de déterminer les vrais multiplets des fragments chargés correspondant aux ions primaires parents ; (h) générer les spectres de masse de dissociation correspondant respectivement aux ions primaires parents d'intérêt, comprenant les pics associés aux vrais multiplets des fragments identifiés.

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