Method and apparatus for calibrating spherical objects using...

G - Physics – 01 – B

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G01B 5/20 (2006.01) A61B 19/00 (2006.01) G01B 5/004 (2006.01) G01B 5/012 (2006.01) G01B 5/213 (2006.01) G08C 21/00 (2006.01)

Patent

CA 2597957

A method of determining a center of curvature (39) of the spherical outer surface (42,52) of an object (40,50) using a computer system (90) is provided. The method includes defining at least one contact region on the spherical outer surface (42) in a plane (24) substantially tangential to a circumference thereof and a first reference axis (26) normal to said plane (24). Spatial coordinates of at least one of a first and a second geometric parameter are determined, the first geometric parameter including at least two points (35) located on the spherical outer surface (42) and the second geometric parameter including a second reference axis (45) normal to the spherical outer surface (42). The center of curvature (39) of the spherical outer surface (42) is then calculated using the first reference axis (26) and at least one of the first and second geometric parameters. An associated system (90) and calibration device (10) is also provided.

L'invention concerne un procédé permettant de déterminer un centre de sphéricité (39) de la surface extérieure sphérique (42,52) d'un objet (40,50) au moyen d'un système informatique (90). Ce procédé consiste à définir au moins une région de contact sur la surface extérieure sphérique (42) dans un plan (24) sensiblement tangentiel à une circonférence et un premier axe de référence (26) perpendiculaire à ce plan (24). Des coordonnées spatiales d'au moins un premier et un second paramètres géométriques sont déterminées, le premier paramètre géométrique comprenant au moins deux points (35) situés sur la surface extérieure sphérique (42) et le second paramètre géométrique comprenant un second axe de référence (45) perpendiculaire à la surface extérieure sphérique (42). Le centre de sphéricité (39) de la surface extérieure sphérique (42) est ensuite calculé à l'aide du premier axe de référence (26) et d'au moins un des deux paramètres géométriques. L'invention concerne également un système associé (90) et un dispositif d'étalonnage (10).

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