G - Physics – 01 – J
Patent
G - Physics
01
J
G01J 9/00 (2006.01)
Patent
CA 2750694
The invention relates to a method for measuring a wave surface of an optical component consisting of a stack of at least two layers with different refractive indices based on reflection or transmission measurements of points located on one surface of said optical component.
L'invention concerne un procédé de mesure d'une surface d'onde d'un composant optique formé d'un empilement d'au moins deux couches d'indices de réfraction différents à partir de mesures de réflexion ou de transmission de points situés sur une face dudit composant optique.
Commissariat A. L'energie Atomique Et Aux Energies Alternatives
Goudreau Gage Dubuc
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