G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 23/09 (2006.01) G01B 15/02 (2006.01) G01F 23/00 (2006.01) G01F 23/288 (2006.01) G01N 23/204 (2006.01) G01T 3/00 (2006.01)
Patent
CA 2122130
ABSTRACT OF THE DISCLOSURE A process measurement system utilizes fast neutron backscattering for measuring density, level, and interfaces of substantially non-hydrogenous materials, that is, materials other than those containing hydrogen. Measurement of materials in thick walled vessels is accommodated. The system contains a fast neutron source for emitting neutrons into the material to be measured. A detection system is mounted near the neutron source to receive the backscattered neutrons. An energy degradation system reduces the energy level of the fast neutrons down to a desired range for detection.
Kay-Ray/sensall Inc.
Marks & Clerk
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