Method and apparatus for diagnosing difficult to diagnose...

G - Physics – 05 – B

Patent

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G05B 23/02 (2006.01)

Patent

CA 2387929

A method and apparatus for determining the root cause of no trouble found events in a machine is disclosed. The actual faults occurring during a predetermined time interval prior to the no trouble found event are analyzed and correlated with the no trouble found events in an effort to identify those actual faults that have a high correlation with each no trouble found event. If a high correlation is not found, then the no trouble found event is analyzed off-line to determine the root cause.

L'invention concerne un procédé et un appareil destinés à déterminer la cause fondamentale d'événements </= pas d'anomalie >/= au niveau d'une machine. Les défauts réels se produisant au cours d'un intervalle de temps prédéterminé antérieur à l'événement </= pas d'anomalie >/= sont analysés et corrélés aux événements </= pas d'anomalie >/= , afin d'identifier les défauts réels présentant un degré de corrélation élevé avec chaque événement </= pas d'anomalie >/= . En cas de degré de corrélation élevé, l'événement </= pas d'anomalie >/= est analysé hors ligne, afin de déterminer la cause fondamentale.

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