Test strip analysis system

Details Test strip analysis system Test strip analysis system

G - Physics

01

N

G01N 33/52 (2006.01) G01N 21/86 (2006.01)

Patent

CA 2119816

A test strip analysis system consists of an analysis apparatus with a test strip holding means and matching test strips. The test strip holding means serves to position the test strip in a defined position relative to a measuring unit. It comprises a test strip seating means and a guide for the test strip. Exact positioning with simple handling and without sophisticated mechanical elements is achieved by the fact that at least one part of the test strip seating means, in the area in which, in the measuring position, the front section of the test strip is located, is formed as a support which is offset in height relative to the middle plane of the test field area, the test strip,,holding means comprising at the same time a pressure element which in the measuring position presses between the support and the test field area of the test strip against the side opposite the seating means of the latter. The test strip is consequently subjected to bending stress, whereby the particular distance of the at least one test field from the measuring unit is ensured.

Affiliated with

Also associated with

Rating

Test strip analysis system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test strip analysis system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test strip analysis system will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1980912