Method and apparatus for analyzing configuration errors in a...

Details Method and apparatus for analyzing configuration errors in a... Method and apparatus for analyzing configuration errors in a...

G - Physics

06

F

G06F 19/00 (2006.01) G06F 7/64 (2006.01) G06F 7/66 (2006.01) G06Q 10/00 (2006.01)

Patent

CA 2225544

Metric values derived from levels of indenture are used by producers to address statistically critical errors effecting producibility. The invention provides a machine implemented diagnostic method for determining the severity of an initial failure, predicts the severity of side effects of the failure and its correction, and gauges the overall effect the failure has on producibility.

Des valeurs exprimées en unités SI, obtenues à partir de niveaux hiérarchiques de positions en retrait, sont utilisées par des producteurs pour appréhender des erreurs critiques sur le plan statistique, et qui affectent la productibilité. L'invention concerne un procédé de diagnostic, appliqué par un matériel, servant à déterminer la gravité d'un défaut initial, à prédire la gravité des effets secondaires du défaut et de sa correction et à évaluer l'effet d'ensemble que le défaut exerce sur la productibilité.

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