G - Physics – 01 – R
Patent
G - Physics
01
R
G01R 27/26 (2006.01) G01R 31/36 (2006.01)
Patent
CA 2359883
The invention relates to a method of determining the output capacitance of a voltage supply device, as well as a voltage supply device and an X-ray apparatus. To determine the output capacitance of a voltage supply device in a simple manner, a measuring method is proposed in which an output voltage of a predefined first measuring voltage value is generated and, subsequently, the voltage supply is turned off, so that the output capacitance is discharged through at least one precision resistor provided in the voltage supply device, the output capacitance being calculated from the discharge curve.
Gercke Thorsten
Hattrup Christian
Loef Christoph
Fetherstonhaugh & Co.
Koninklijke Philips Electronics N.v.
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