High speed fail processor

Details High speed fail processor High speed fail processor

G - Physics

06

F

354/222

G06F 11/00 (2006.01) G01R 31/3193 (2006.01) G01R 31/319 (2006.01)

Patent

CA 2038295

Abstract An apparatus for processing failure information received from a node of a circuit under test. The apparatus includes a fail processor which receives test data from a node and generates failure data based upon the test data, a plurality of fail memories, each memory being configured to receive and store certain fail data, and a sequence memory configured to store sequence information indicating in what order the failure data is stored in the plurality of fail memories.

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