Test device sample delivery means

G - Physics – 01 – N

Patent

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G01N 33/52 (2006.01) B01L 3/00 (2006.01)

Patent

CA 2062082

ABSTRACT OF THE DISCLOSURE A test device is disclosed having a semicrater sample application site attached or associated with a substrate. The semicrater sample application site has walls of nonuniform height surrounding the area designed to receive the applica- tion of sample. In particular, the walls of the semicrater on one side are higher than the walls of the semicrater on the opposite side. This facilitates the application of a small amount of sample directly onto the desired sample application site. MS-1653

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