G - Physics – 01 – S
Patent
G - Physics
01
S
343/75
G01S 1/02 (2006.01) G01S 1/54 (2006.01)
Patent
CA 1152616
ABSTRACT IMPROVEMENTS IN OR RELATING TO MICROWAVE LANDING SYSTEMS A system of operation for a scanning beam microwave landing system having aerial means for scanning a narrow microwave beam TO and FRO through a scanned angular sector and for transmitting OCI signals with a relatively wider beam pattern to cover OCI sectors to the left and to the right of the scan sector comprising, energising the aerial means before the TO scan begins to produce the said wide beam pattern on the left of the scanned sector at a time corresponding to a predetermined negative angle of the TO scan with reference to the centre line of the scanned sector and which is outside the angular limit of the scanned sector, energising the aerial means after the TO scan finishes to produce the said wider beam pattern on the right of the scanned sector at a time corresponding to the said predetermined angle of the TO scan but positive with respect to the centre line through the scanned sector, and outside the angular limit of the scanned sector, energising the aerial means before the FRO scan begins to produce the said wider beam pattern again on the right of the scanned sector and at a time corresponding to the said positive predetermined angle as applied to the FRO scan and outside the angular limit of the scanned sector and energising the aerial means after the FRO scan has finished to produce the said wider beam pattern on the left of the scanned sector at a time corresponding to the said negative predetermined angle of the FRO scan and outside the angular limit of the scanned sector.
355632
Borden Ladner Gervais Llp
Plessey Overseas Limited
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